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NVME_DEVICE_SELF_TEST_LOG

構造体

サイズx64: 564 バイト / x86: 564 バイト

サイズ=各フィールドのバイト数(x64/x86 で異なる場合は x64/x86 と併記)。x64/x86 列=フィールドのバイトオフセット(HSPで dupptr / lpoke / wpoke 等に使用)。

フィールド

フィールド	型	サイズ	x64	x86	説明
CurrentOperation	_CurrentOperation_e__Struct	1	+0	+0	進行中の自己テスト操作の種別を示す。0は実行なし。
CurrentCompletion	_CurrentCompletion_e__Struct	1	+1	+1	進行中テストの完了率。百分率で表す。
Reserved	BYTE	2	+2	+2	予約領域。将来拡張用で0とする。
ResultData	NVME_DEVICE_SELF_TEST_RESULT_DATA	560	+4	+4	直近の自己テスト結果エントリの配列(最大20件)。

構造体: _CurrentOperation_e__Struct x64 1B / x86 1B

フィールド	型	サイズ	x64	x86
_bitfield	BYTE	1	+0	+0

構造体: _CurrentCompletion_e__Struct x64 1B / x86 1B

フィールド	型	サイズ	x64	x86
_bitfield	BYTE	1	+0	+0

各言語での定義

#include <windows.h>

// NVME_DEVICE_SELF_TEST_RESULT_DATA  (x64 28 / x86 28 バイト)
#pragma pack(push, 1)
typedef struct NVME_DEVICE_SELF_TEST_RESULT_DATA {
    _Status_e__Struct Status;
    BYTE SegmentNumber;
    _ValidDiagnostics_e__Struct ValidDiagnostics;
    BYTE Reserved;
    ULONGLONG POH;
    DWORD NSID;
    ULONGLONG FailingLBA;
    _StatusCodeType_e__Struct StatusCodeType;
    BYTE StatusCode;
    WORD VendorSpecific;
} NVME_DEVICE_SELF_TEST_RESULT_DATA;
#pragma pack(pop)

// NVME_DEVICE_SELF_TEST_LOG  (x64 564 / x86 564 バイト)
typedef struct NVME_DEVICE_SELF_TEST_LOG {
    _CurrentOperation_e__Struct CurrentOperation;
    _CurrentCompletion_e__Struct CurrentCompletion;
    BYTE Reserved[2];
    NVME_DEVICE_SELF_TEST_RESULT_DATA ResultData[20];
} NVME_DEVICE_SELF_TEST_LOG;

using System;
using System.Runtime.InteropServices;

[StructLayout(LayoutKind.Sequential, Pack = 1, CharSet = CharSet.Unicode)]
public struct NVME_DEVICE_SELF_TEST_RESULT_DATA
{
    public _Status_e__Struct Status;
    public byte SegmentNumber;
    public _ValidDiagnostics_e__Struct ValidDiagnostics;
    public byte Reserved;
    public ulong POH;
    public uint NSID;
    public ulong FailingLBA;
    public _StatusCodeType_e__Struct StatusCodeType;
    public byte StatusCode;
    public ushort VendorSpecific;
}

[StructLayout(LayoutKind.Sequential, CharSet = CharSet.Unicode)]
public struct NVME_DEVICE_SELF_TEST_LOG
{
    public _CurrentOperation_e__Struct CurrentOperation;
    public _CurrentCompletion_e__Struct CurrentCompletion;
    [MarshalAs(UnmanagedType.ByValArray, SizeConst = 2)] public byte[] Reserved;
    [MarshalAs(UnmanagedType.ByValArray, SizeConst = 20)] public NVME_DEVICE_SELF_TEST_RESULT_DATA[] ResultData;
}

Imports System.Runtime.InteropServices

<StructLayout(LayoutKind.Sequential, Pack:=1, CharSet:=CharSet.Unicode)>
Public Structure NVME_DEVICE_SELF_TEST_RESULT_DATA
    Public Status As _Status_e__Struct
    Public SegmentNumber As Byte
    Public ValidDiagnostics As _ValidDiagnostics_e__Struct
    Public Reserved As Byte
    Public POH As ULong
    Public NSID As UInteger
    Public FailingLBA As ULong
    Public StatusCodeType As _StatusCodeType_e__Struct
    Public StatusCode As Byte
    Public VendorSpecific As UShort
End Structure

<StructLayout(LayoutKind.Sequential, CharSet:=CharSet.Unicode)>
Public Structure NVME_DEVICE_SELF_TEST_LOG
    Public CurrentOperation As _CurrentOperation_e__Struct
    Public CurrentCompletion As _CurrentCompletion_e__Struct
    <MarshalAs(UnmanagedType.ByValArray, SizeConst:=2)> Public Reserved() As Byte
    <MarshalAs(UnmanagedType.ByValArray, SizeConst:=20)> Public ResultData() As NVME_DEVICE_SELF_TEST_RESULT_DATA
End Structure

import ctypes
from ctypes import wintypes

class NVME_DEVICE_SELF_TEST_RESULT_DATA(ctypes.Structure):
    _pack_ = 1
    _fields_ = [
        ("Status", _Status_e__Struct),
        ("SegmentNumber", ctypes.c_ubyte),
        ("ValidDiagnostics", _ValidDiagnostics_e__Struct),
        ("Reserved", ctypes.c_ubyte),
        ("POH", ctypes.c_ulonglong),
        ("NSID", wintypes.DWORD),
        ("FailingLBA", ctypes.c_ulonglong),
        ("StatusCodeType", _StatusCodeType_e__Struct),
        ("StatusCode", ctypes.c_ubyte),
        ("VendorSpecific", ctypes.c_ushort),
    ]

class NVME_DEVICE_SELF_TEST_LOG(ctypes.Structure):
    _fields_ = [
        ("CurrentOperation", _CurrentOperation_e__Struct),
        ("CurrentCompletion", _CurrentCompletion_e__Struct),
        ("Reserved", ctypes.c_ubyte * 2),
        ("ResultData", NVME_DEVICE_SELF_TEST_RESULT_DATA * 20),
    ]

#[repr(C, packed(1))]
pub struct NVME_DEVICE_SELF_TEST_RESULT_DATA {
    pub Status: _Status_e__Struct,
    pub SegmentNumber: u8,
    pub ValidDiagnostics: _ValidDiagnostics_e__Struct,
    pub Reserved: u8,
    pub POH: u64,
    pub NSID: u32,
    pub FailingLBA: u64,
    pub StatusCodeType: _StatusCodeType_e__Struct,
    pub StatusCode: u8,
    pub VendorSpecific: u16,
}

#[repr(C)]
pub struct NVME_DEVICE_SELF_TEST_LOG {
    pub CurrentOperation: _CurrentOperation_e__Struct,
    pub CurrentCompletion: _CurrentCompletion_e__Struct,
    pub Reserved: [u8; 2],
    pub ResultData: [NVME_DEVICE_SELF_TEST_RESULT_DATA; 20],
}

import "golang.org/x/sys/windows"

type NVME_DEVICE_SELF_TEST_RESULT_DATA struct {
	Status _Status_e__Struct
	SegmentNumber byte
	ValidDiagnostics _ValidDiagnostics_e__Struct
	Reserved byte
	POH uint64
	NSID uint32
	FailingLBA uint64
	StatusCodeType _StatusCodeType_e__Struct
	StatusCode byte
	VendorSpecific uint16
}

type NVME_DEVICE_SELF_TEST_LOG struct {
	CurrentOperation _CurrentOperation_e__Struct
	CurrentCompletion _CurrentCompletion_e__Struct
	Reserved [2]byte
	ResultData [20]NVME_DEVICE_SELF_TEST_RESULT_DATA
}

type
  NVME_DEVICE_SELF_TEST_RESULT_DATA = packed record
    Status: _Status_e__Struct;
    SegmentNumber: Byte;
    ValidDiagnostics: _ValidDiagnostics_e__Struct;
    Reserved: Byte;
    POH: UInt64;
    NSID: DWORD;
    FailingLBA: UInt64;
    StatusCodeType: _StatusCodeType_e__Struct;
    StatusCode: Byte;
    VendorSpecific: Word;
  end;

  NVME_DEVICE_SELF_TEST_LOG = record
    CurrentOperation: _CurrentOperation_e__Struct;
    CurrentCompletion: _CurrentCompletion_e__Struct;
    Reserved: array[0..1] of Byte;
    ResultData: array[0..19] of NVME_DEVICE_SELF_TEST_RESULT_DATA;
  end;

const NVME_DEVICE_SELF_TEST_RESULT_DATA = extern struct {
    Status: _Status_e__Struct,
    SegmentNumber: u8,
    ValidDiagnostics: _ValidDiagnostics_e__Struct,
    Reserved: u8,
    POH: u64,
    NSID: u32,
    FailingLBA: u64,
    StatusCodeType: _StatusCodeType_e__Struct,
    StatusCode: u8,
    VendorSpecific: u16,
};

const NVME_DEVICE_SELF_TEST_LOG = extern struct {
    CurrentOperation: _CurrentOperation_e__Struct,
    CurrentCompletion: _CurrentCompletion_e__Struct,
    Reserved: [2]u8,
    ResultData: [20]NVME_DEVICE_SELF_TEST_RESULT_DATA,
};

type
  NVME_DEVICE_SELF_TEST_RESULT_DATA {.packed.} = object
    Status: _Status_e__Struct
    SegmentNumber: uint8
    ValidDiagnostics: _ValidDiagnostics_e__Struct
    Reserved: uint8
    POH: uint64
    NSID: uint32
    FailingLBA: uint64
    StatusCodeType: _StatusCodeType_e__Struct
    StatusCode: uint8
    VendorSpecific: uint16

  NVME_DEVICE_SELF_TEST_LOG {.bycopy.} = object
    CurrentOperation: _CurrentOperation_e__Struct
    CurrentCompletion: _CurrentCompletion_e__Struct
    Reserved: array[2, uint8]
    ResultData: array[20, NVME_DEVICE_SELF_TEST_RESULT_DATA]

align(1)
struct NVME_DEVICE_SELF_TEST_RESULT_DATA
{
    _Status_e__Struct Status;
    ubyte SegmentNumber;
    _ValidDiagnostics_e__Struct ValidDiagnostics;
    ubyte Reserved;
    ulong POH;
    uint NSID;
    ulong FailingLBA;
    _StatusCodeType_e__Struct StatusCodeType;
    ubyte StatusCode;
    ushort VendorSpecific;
}

struct NVME_DEVICE_SELF_TEST_LOG
{
    _CurrentOperation_e__Struct CurrentOperation;
    _CurrentCompletion_e__Struct CurrentCompletion;
    ubyte[2] Reserved;
    NVME_DEVICE_SELF_TEST_RESULT_DATA[20] ResultData;
}

HSP用定義

HSP3.7/3.8 は構造体機能が無いため4byte整数配列(dim)+peek/poke で操作(32/64bitでサイズ・位置が異なる場合はタブで分割)。IronHSP は NSTRUCT(#defstruct/stdim/->)で32/64bit共通。

; HSP3.7/3.8 は構造体機能が無いため、4byte整数の配列変数で操作します。(x64 レイアウト)
; NVME_DEVICE_SELF_TEST_LOG サイズ: 564 バイト(x64)
dim st, 141    ; 4byte整数×141(構造体サイズ 564 / 4 切り上げ)
; CurrentOperation : _CurrentOperation_e__Struct (+0, 1byte)  varptr(st)+0 を基点に操作(1byte:入れ子/配列)
; CurrentCompletion : _CurrentCompletion_e__Struct (+1, 1byte)  varptr(st)+1 を基点に操作(1byte:入れ子/配列)
; Reserved : BYTE (+2, 2byte)  varptr(st)+2 を基点に操作(2byte:入れ子/配列)
; ResultData : NVME_DEVICE_SELF_TEST_RESULT_DATA (+4, 560byte)  varptr(st)+4 を基点に操作(560byte:入れ子/配列)
; ※4byte境界の整数は添字 st.N(N=オフセット/4)で読み書き可。それ以外は peek/poke 系を使用。

; IronHSP は NSTRUCT(構造体)をサポート。32bit/64bit どちらでも同じコードで動作します。
; ※GUID・入れ子構造体はデフォルト型でないため、依存する #defstruct を先に定義(下記に同梱)。
#defstruct global NVME_DEVICE_SELF_TEST_RESULT_DATA, pack=1
    #field _Status_e__Struct Status
    #field byte SegmentNumber
    #field _ValidDiagnostics_e__Struct ValidDiagnostics
    #field byte Reserved
    #field int64 POH
    #field int NSID
    #field int64 FailingLBA
    #field _StatusCodeType_e__Struct StatusCodeType
    #field byte StatusCode
    #field short VendorSpecific
#endstruct

#defstruct global NVME_DEVICE_SELF_TEST_LOG
    #field _CurrentOperation_e__Struct CurrentOperation
    #field _CurrentCompletion_e__Struct CurrentCompletion
    #field byte Reserved 2
    #field NVME_DEVICE_SELF_TEST_RESULT_DATA ResultData 20
#endstruct

stdim st, NVME_DEVICE_SELF_TEST_LOG        ; NSTRUCT 変数を確保